Rohde & Schwarz will present its advanced test and measurement solutions for the embedded industry at the Embedded World Exhibition & Conference in Nuremberg, Germany. Visitors can find the T&M expert at booth 4-218 in hall 4 of the Nuremberg Exhibition Center from March 11 to 13, 2025. The event provides an opportunity for visitors to engage with the company’s experts and delve into the latest technologies designed to enhance device energy efficiency, expedite EMC compliance within the design process, speed up digital protocol debugging, and meet required regulatory standards for wireless interfaces.
Ensuring energy efficiency and reliability in power electronics
At Embedded World, Rohde & Schwarz will showcase its ever-growing range of next-generation oscilloscopes with the R&S®MXO 4, R&S®MXO 5, and the rackmount-optimized R&S®MXO 5C series. Visitors can also experience the R&S®ScopeStudio, a new solution that brings the functionality of the MXO to a PC, making visualizing, analyzing, and sharing oscilloscope measurements easier. In combination with matching high-quality active and passive probes, the exceptionally fast MXO oscilloscopes help design engineer enhance the reliability of their power electronics and other embedded systems.
The eight-channel MXO 5 oscilloscope coupled with the R&S RT-ZISO Isolated probing system, for instance, delivers unparalleled accuracy, sensitivity, dynamic range, and bandwidth. These features make it the go-to solution for the characterization, verification, and debugging of the next generation of wide-bandgap (WBG) power designs. WBG materials such as SiC and GaN boost the efficiency of power designs, but the WBG semiconductor's fast switching capability must be thoroughly characterized. In another setup, the MXO 5 oscilloscope will simplify the validation of the multi-phase buck converter design, promising reliable results. High-speed multi-phase buck converter SoCs offer operational advantages for big data applications and others necessitating lower voltages, higher currents, and faster switching times.
Battery life is a critical specification for battery-powered devices. Visitors can monitor how GPS impacts power consumption in real-time in a battery simulation setup using the R&S®NGU source measure unit. A novel analysis tool aids developers in examining power consumption data collected with the R&S NGU, allowing them to measure current consumption during all phases and transitions from sleep to active mode.
Debugging electromagnetic emissions and EMI compliance testing
Every electronic controller is susceptible to conducted or radiated electromagnetic emissions. Early debugging helps to isolate and correct EMI issues and accelerates time-to-market. As a leader in EMC testing, Rohde & Schwarz will present solutions that integrate EMI testing into the product design process. Visitors can learn how to use the R&S®RTO6 oscilloscope for EMI debugging or the R&S®EPL1000 EMI test receiver for conducted EMI measurements. The R&S EPL1000 delivers fast, accurate,e and reliable EMI pre-compliance and compliance measurements up to 30 MHz. It offers competitive pricing in the full CISPR 16-1-1 compliance receiver class for both device developers and conformance test houses.
Verifying signal integrity in high-speed digital designs
High-speed digital interfaces are integral to electronic designs, with increasing data rates and integration density posing new challenges at the IC, board, and system levels. Trade show visitors can learn at the Rohde & Schwarz booth about powerful tools for system verification, debugging, and compliance testing for high-speed interfaces, PCBs, and interconnects. Demonstrations will feature powerful verification and debugging tools for DDR5 system designs and Automotive Ethernet MGBase-T1 devices, both utilizing the R&S®RTP oscilloscope.
Rohde & Schwarz will debut the new R&S ZNB3000 vector network analyzer at Embedded World. This newly launched vector network analyzer redefines the standard for speed, precision, and versatility. With its industry-leading dynamic range, fast measurement speed, and scalable upgrades, it is perfectly suited for the most demanding applications, such as data transmission and signal integrity applications. Visitors can experience the instrument’s advanced de-embedding techniques that enable precise and efficient S-parameter measurements. These techniques facilitate characterizing the test fixture, extracting the S-parameters, and de-embedding the test fixture in a user-friendly manner.
Bluetooth and wireless connectivity testing
Bluetooth® is the leading technology for short-range, low-power wireless communications. With the CMW platform, Rohde & Schwarz offers a comprehensive, fully automated test solution approved by the Bluetooth® SIG for verifying the physical layer functions of new Bluetooth® Low Energy (LE) and Bluetooth® Classic. The R&S®CMW270 wireless connectivity test platform, on display in the embedded world, will verify the new LE feature Bluetooth® Channel Sounding (CS), which enhances the positioning capabilities of devices based on high-accuracy distance measurements.
The next generation of WLAN technology, designed for extremely high data throughput, will be more powerful, efficient, and complex. The future-proof CMP180 radio communication tester is ideal for performing typical measurements on NR FR1, UWB, Wi-Fi 7, and first Wi-Fi 8 devices during R&D and production. New features of the non-signaling tester displayed in the embedded world will include Wi-Fi 8 and UWB measurements with a focus on production.
These and other test solutions tailored for the embedded industry can be found at the Rohde & Schwarz booth 4-218 in hall 4 at the Embedded World Exhibition & Conference from March 11 to 13, 2025 in Nuremberg, Germany.
Click here to view embedded World 2025 event coverage on EMC Directory.