Langer EMV-Technik Introduces Passive Near-Field Probe Set for E-Field Measurements up to 40 GHz
Langer EMV-Technik, a company that is at the forefront of research, development, and production in the field of EMC, has introduced passive near-field probe set that can be used to conduct electric field (E-field) measurements up to 40 GHz. The HR-E-40-1 probe set has been designed to provide real-time measurements of electric fields on devices such as standard conductors, electrical circuits, and other RF designs. It is ideal for testing and measuring components and devices during design, development, and verification stages.
The probe set includes an E-field probe up to 40 GHz, CS-ESA viewer, ChipScan-ESA viewer software/USB, HR E char, HR-E-40-1 characteristic/USB, HR-E-40-1 user manual, and Case 4 system case near-field probes. It consists of a special probe head that enables measurements to be taken directly on individual conductor tracks to localize E-field sources.
The probe converts high-frequency electric near fields into an electric current or voltage to be measured. It can be connected to various test and measurement equipment such as spectrum analyzers, oscilloscopes, or similar testers.
The measuring tip is decoupled from the cable shield by special damping systems. In addition, the probe contains a current attenuator to provide sheath current attenuation. It has a distance of 0.5 mm from the measuring electrode to the measuring tip and can easily support hand-held measurements. It also offers a spatial resolution of 0.2 mm and is internally matched to 50 ohms.
The probes measure 145 x 9 x 9 mm with 2.92 mm (K)-female/jack connectors and should be used with the provided probe holder in the scanner.
Click here to learn more about the HR-E-40-1 near-field probe set.
Click here to view other near-field probe solutions from the leading manufacturers on everything RF.
Please wait...