Keysight Organized EMC Seminar in Co-Sponsorship with Y.I.C Technologies
Keysight and Y.I.C Technologies organized and hosted an EMC seminar on 20th April 2023, at Keysight Office, 610 Wharfedale Rd, Winnersh, Wokingham. In this seminar, EMC tips and solutions were provided to help engineers troubleshoot tricky EMC challenges.
Synopsis of Presentations:
Keysight Technologies - Callum Williams
How to perform pre-compliance EMC measurements with a spectrum analyser
A spectrum analyzer with built-in CISPR and MIL-STD compliant bandwidths, detectors and automated testing to regulatory Limit Lines with user-selected margins can save a valuable amount of time and money in testing products for EMC emissions before they go through full compliance testing in a certified lab.
Their solution expert guided the attendees through the steps taken: Scan, Search, and Measure, to perform a practical pre-compliance EMC measurement using a spectrum analyzer.
MVG - Paul Duxbury
Design Issues and Considerations when Planning a Shielded Chamber
When looking to install a shielded chamber, there are several aspects that one needs to take into account, depending on what the chamber will be used for, and the size of the chamber. During this presentation, their expert will review some of these, and provide some guidance on the areas that one, as the user of the chamber, need to consider when starting to plan the installation of a new chamber. Their expert also considered areas in which one, as the chamber supplier, can assist with and provide design input on.
Y.I.C. Technologies - Arturo Mediano
Exploring EMC/EMI Issues with Real-Time Scanning Techniques
During this presentation, they explored the high-speed PCBs design challenges one typically finds at the EMI/EMC level. They used a set of electronic PCB boards to demonstrate some of the most classic problems PCB designers might implement in a new PCB design.
10 Simple circuits have been designed to demonstrate issues that can be detected and illustrated by the use of a Spectrum Analyzer, Near Field Probes, and Near Field scanner. Each circuit will provide an in-depth analysis that relates to a specific EMC/EMI key design fault.
During the live session, they explored the following issues:
- IC Decoupling
- Crosstalk at the component level
- Shielding Leakage
- Effect of Ferrite in signal paths
- Slots in ground planes
- Trace on Boards edge
- Controlling current path
- How layout changes filter behavior
- Near Field Communication (NFC) and more
AR - David Feltbower
EMC Immunity Multi-Tone: Testing, Theory, and Practice
Multi-tone testing has many benefits. While the multi-tone method was initially implemented to increase the speed of IEC 61000-4-3 radiated immunity testing, it has been found that this method also improves equipment efficiency, offers greater flexibility to truly test the equipment (EUT) under real-world threat conditions, and can be fully compliant to standards. Other benefits include more efficient use of finite financial and human resources and faster time-to-market for new and enhanced products.
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