The HR-E-40-1 from Langer EMV-Technik is a Passive Near-Field Probe Set for E-field measurements up to 40 GHz. It designed to provide real-time measurements of electric fields on devices such as standard conductors, electrical circuits, and other RF designs. The probe set is ideal for testing and measuring components and devices during design, development, and verification stages. It allows recording of the near-fields and derive a detailed field map of the component to be measured.

The probe set includes an E-field probe up to 40 GHz, CS-ESA viewer, ChipScan-ESA viewer software/USB, HR E char, HR-E-40-1 characteristic/USB, HR-E-40-1 user manual, and Case 4 system case near-field probes. It consists of a special probe head that enables measurements to be taken directly on individual conductor tracks to localize E-field sources.

The HR-E-40-1 has an electrode-to-tip distance of 0.5 mm to support hand-held measurements and a spatial resolution of 0.2 mm. It decouples the measuring tip from the cable shield using special damping systems. The measuring tip is decoupled from the cable shield by special damping systems and the probe contains a current attenuator to provide sheath current attenuation. It measures 145 x 9 x 9 mm, has 2.92 mm (K)-female/jack connectors and should be used with the provided probe holder in the scanner.