Integrated Circuits (ICs) are the backbone of today's electronic devices, from computers to cell phones. Usually, while operating, ICs may emit undesired electromagnetic energy in the form of radiated emission (via air) and conducted emission (i.e., RF noise current conducted via IC pins, PCB traces, wire/cable). The undesired electromagnetic energy may interfere with the operation of/affect other nearby components/devices; this phenomenon is known as electromagnetic interference (EMI). 

Electromagnetic Compatibility (EMC) refers to the ability/capability of electrical and electronic devices and systems to operate properly in their intended electromagnetic environment without causing or suffering from EMI. An EMC-compatible IC (or device) will not emit intolerable electromagnetic emissions and have sufficient immunity against electromagnetic interference from other nearby device(s).

The EMC compatibility of integrated circuits (ICs) is gaining importance due to evolving applications and technological advancements, necessitating standardized EMC testing procedures/methods for consistent evaluation and comparison of devices.  The EMC performance/ EMC compatibility of ICs is evaluated using EMC testing. The EMC testing involves emission measurement testing and immunity testing. The emission measurement test is performed to measure the amount of EMI emitted by the IC (or device). The immunity test is performed to measure the IC’s ability to withstand EMI from external sources or devices.   The results of emission and immunity testing can provide valuable information for the improvement of an IC both in terms of functionality and EMC performance. 

The EMC emission and immunity testing is performed as per EMC standards related to the product or device. IEC (International Electrotechnical Commission) has published standardized emissions and immunity EMC test methods/standards for ICs. These IEC IC EMC emission measurement standards (IEC 61967 series) and immunity test standards/test methods are provided below. 

IEC IC EMC emission measurement standards (IEC 61967 series):

IEC 61967 series is published in several parts (listed below), under the general title Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz:

IEC 61967-1: Titled "Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions". 

IEC 61967-2:  Titled "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method".

IEC 61967-3:  Titled "Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method".

IEC 61967-4: Titled "Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method".

IEC 61967-5: Titled "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method".

IEC 61967-6: Titled "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method".

IEC 61967-8: Titled "Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method".

IEC IC EMC immunity test standards (IEC 62132 series): 

The IEC 62132 series is published in several parts (listed below), under the general title Integrated circuits – Measurement of electromagnetic immunity. 

IEC 62132-1: Titled "Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions".

IEC 62132-2: Titled "Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method".

IEC 62132-4: Titled "Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method".

IEC 62132-5: Titled "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method".

IEC 62132-8: Titled "Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method".

IEC TS 62132-9: Titled " Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method".

These standards outline test procedures, test set-up, and other related details for testing the emissions and immunity of integrated circuits to ensure they comply with electromagnetic compatibility (EMC) requirements. IC manufacturers need to adhere to these standards to guarantee the reliability and performance of their products in various electromagnetic environments, enhancing overall product quality and customer satisfaction.