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Langer EMV-Technik, a leader in research, development, and production in the field of EMC, has introduced cutting-edge ICR near-field probes that are set to transform the development of electrical assemblies. These probes, essential for both high-frequency and EMC technology, offer a range of benefits, including minimal feedback effects due to their contactless measurement capabilities, versatile applications thanks to an optimized tip design, and the ability to examine even the most inaccessible structures. With their broad frequency spectrum coverage and ease of handling, these probes integrate seamlessly into the development process, making them invaluable tools for evaluating simulation values, locating interference sources, and conducting real-time monitoring.

One of the standout features of Langer EMV’s near-field probes is their ability to separately measure magnetic and electric fields. This separation allows for a more detailed analysis of the interactions within assemblies, providing a significant advantage in assessing the correlation of effects. By evaluating these fields individually, engineers can derive current and voltage distributions from the field data, leading to a more comprehensive understanding of the assembly's performance. Langer EMV-Technik GmbH has ensured that their magnetic field probes are shielded from electric fields, optimizing the accuracy of these measurements.

The high spatial resolution of Langer EMV’s near-field microprobes, particularly those in the ICR series, enables precise measurement of field distributions in integrated circuits. With resolutions ranging from 70 to 250 micrometers, these probes can graphically display field distributions, such as those observed in the processor chip of a Raspberry Pi at different spectral frequencies. This high resolution is especially beneficial for investigating safety-critical functions in integrated circuits and detecting vulnerabilities in side-channel attacks. In addition to the probes, Langer EMV offers pulsed field generators for injecting interference signals, further enhancing the probes' effectiveness in assessing circuit security. Overall, these advanced near-field probes represent a crucial advancement for developers and researchers in the field of electromagnetic compatibility.

Click here to learn more about Langer EMV's ICR HH100-27 Near-Field Probe.