Langer EMV Introduces P512 probe and Direct Power Injection (DPI) Method
Langer EMV, a leader in research, development, and production in the field of EMC, has introduced the P512 probe and Direct Power Injection (DPI) method to address the evolving challenges in testing modern integrated circuits (ICs) for susceptibility to interference. With increasing integration density and smaller semiconductor structures in ICs, traditional testing methods are proving inadequate against fast and high-frequency interference. The P512 probe is designed to overcome these limitations by extending the frequency capability for DPI tests up to 12 GHz, significantly higher than the current industry standards.
Traditionally, DPI testing involves feeding RF power directly into IC pins using specialized test PCBs and connectors. The P512 probe simplifies this process by integrating a large-area ground connection and eliminating the need for complex PCB designs. This innovation allows for flexible positioning on IC pins, enhancing testing accuracy and automation potential. Moreover, the probe's internal design includes adjustable coupling capacitance, further optimizing its suitability across various IC configurations and testing requirements.
The versatility of the P512 extends beyond DPI testing; it also serves as an RF probe for measuring high-frequency signals up to 12 GHz. The probe ensures reliable and distortion-free measurements by minimizing coupling loops and maintaining direct ground contact near the measuring tip. This capability is particularly beneficial for ICs manufactured with flip-chip technology housed in Ball Grid Array (BGA) packages, which are known to be more susceptible to interference in higher frequency ranges. Langer EMV's P512 represents a significant advancement in IC testing technology, promising enhanced reliability and efficiency in assessing interference susceptibility in modern electronics.
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