Langer EMV Introduces E1 Immunity Development System for EMC Measurements
Langer EMV-Technik has introduced a groundbreaking E1 Immunity development system for EMI suppression in printed circuit boards, detecting burst and ESD faults, and checking the effect of EMC measures. Field sources are crucial for evaluating the electromagnetic compatibility of electronic assemblies by applying targeted electric or magnetic fields. Traditionally, this process begins with low-resolution sources that influence broad areas, helping to identify general fault zones. However, pinpointing exact issues within these zones has required higher resolution sources that deliver precise, concentrated field beams.
The new E1 Immunity system is designed to streamline this process by integrating a comprehensive set of tools for EMI suppression. It allows developers to swiftly detect the root causes of burst and ESD (electrostatic discharge) interference. This capability not only facilitates the identification of specific issues but also aids in testing the effectiveness of corrective measures. The compact design of the E1 set makes it ideal for use on a developer’s desk, offering both convenience and efficiency.
Accompanying the E1 set is a user manual that thoroughly covers EMC mechanisms and provides detailed instructions on basic measuring strategies for interference suppression in printed circuit boards. The E1 set includes a generator specifically for creating burst and ESD disturbances, enabling developers to effectively address and mitigate interference issues during the development phase.
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