ATEC Extends A2LA ISO17025 Capabilities of Accreditation to Calibrate EMC E-Field Probes

ATEC Extends A2LA ISO17025 Capabilities of Accreditation to Calibrate EMC E-Field Probes 712370

Advanced Test Equipment Corporation (ATEC), a leading provider of test and measurement equipment rental, sales, service, and calibration is pleased to announce the expansion of its ISO 17025 accreditation to include EMC E-field probes. This certification attests to ATEC's competency in calibration for a wide range of equipment used in various industries. ATEC, already having been calibrating RF safety E-field probes since 2019, decided to expand this capability to EMC E-field probes to offer more options to their customers.

EMC E-field probes are used in every immunity chamber to verify V/m field strength and are a critical piece of test equipment. Those probes are calibrated in only a handful of laboratories in the U.S., including ATEC's.

ISO 17025 accreditation is recognized globally as the standard for testing and calibration laboratories. This certification requires that laboratories meet rigorous requirements for quality management and technical competency. ATEC's ISO 17025 accreditation renewal and expansion of calibration capabilities demonstrate the company's commitment to maintaining the highest level of quality and precision in all its calibration services.

With the newly added capabilities, ATEC can provide customers with even more comprehensive calibration services, including the ability to calibrate a wider range of electronic testing and measurement equipment used in demanding applications.

"With the addition of EMC probes to our A2LA Scope of Accreditation, our customers will benefit from quicker turnaround times and quality calibration," said Jamison Berg, ATEC Vice President, "We take great pride in offering the highest quality calibration and measurement services to our customers."

ATEC also offers, in many cases, discounted rentals of EMC E-field probes when a company sends in their probe for calibration, thus minimizing the potential downtime in testing.

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Publisher: EMC Directory